2 2 Ju n 20 04 Shot noise in linear macroscopic resistors
نویسندگان
چکیده
We report on a direct experimental evidence of shot noise in a linear macro-scopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffu-sive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. Present results show that neither potential barriers nor the absence of inelastic scattering are necessary to observe shot noise in electronic devices.
منابع مشابه
Shot noise in linear macroscopic resistors.
We report on direct experimental evidence of shot noise in a linear macroscopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffusive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. The present results show that neither potential bar...
متن کاملnoise in linear macroscopic resistors
We report on a direct experimental evidence of shot noise in a linear macro-scopic resistor. The origin of the shot noise comes from the fluctuation of the total number of charge carriers inside the resistor associated with their diffu-sive motion under the condition that the dielectric relaxation time becomes longer than the dynamic transit time. Present results show that neither potential bar...
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تاریخ انتشار 2004